Center for Advanced Metrology Solutions

We are searching data for your request:

Forums and discussions:
Manuals and reference books:
Data from registers:
Wait the end of the search in all databases.
Upon completion, a link will appear to access the found materials.

Imec launches an Advanced Metrology Solutions Center

Imec has officially launched the Center for Advanced Metrology Solutions (CAMS). This center draws on Imec's extensive experience to provide a high-quality commercial service for SSRM (Scanning Spreading Resistance Microscopy) microscopy and a wide range of products and solutions to enable and facilitate electrical measurements of atomic force microscopy.

SSRM microscopy - a technique invented at Imec - is a technique based on electrical atomic force microscopy (AFM) that provides high resolution quantitative transport distributions in 1D, 2D and 3D semiconductor structures, such as thin films, solar cells, MOSFETs, FinFETs, TFETs, etc. Recent advancements in resolution and extension to other semiconductor materials (SiGe, Ge, InGaAs, INP, etc.) have generated a strong and growing interest in the semiconductor community for the characterization of advanced structures. To allow the entire community to benefit from these advancements, Imec now offers a commercial SSRM service to external customers through its newly created Advanced Metrology Solutions Center.


Video: DARPAs Cyber Grand Challenge: Final Event Program


  1. Felding

    very interesting thought

  2. Iphis

    We can talk a lot about this question.

  3. Mikarr

    I join. All of the above is true. We can communicate on this theme. Here or at PM.

  4. Faber

    What are you trying to say?

  5. Nibar

    the bad taste that this

  6. Tyreece

    In it something is. Thank you for the explanation, easier, better ...

Write a message

Previous Article

Digital ID

Next Article

Phrases of the unforgettable Marilyn Monroe